Gregory Perry, CMRP, CRL, is a senior maintenance reliability consultant with Fluke Accelix. He serves as a Certified Reliability Leader with nearly two decades of experience in maintenance and operational best practices. He may be reached at email@example.com. For more information, visit www.accelix.com.
However, M&R leaders know that a wide gap exists in the adoption of IIoT technologies.
Major barriers prevent the use of IIoT. A new concept of connected reliability overcomes those challenges, offering a practical roadmap that can lead to a true IIoT breakthrough. Connectivity of people to the systems and systems to assets anywhere and at all times through smart devices bridges this gap.
Most companies that use IIoT technologies experience tangible business value, but only if they remove or mitigate the barriers to implementation, which include:
- missing or inaccessible data
- reliance on scheduled routes
- lack of connectivity between data and asset management systems
- limited access to relevant data for timely, informed decisions
To move toward CAPM, facilities need connected reliability. A connected reliability framework must consist of the following three essentials:
- comprehensive data collection
- end-to-end connectivity
- empowered teams
Teams must be able to use all data sources and types to meet them wherever they may be in the inherent availability journey. There must be a balance between people and processes—or a reliability culture—and technology.
From a technology viewpoint, this should include handheld tools, wireless sensors, data acquisition, or any other condition or process data. All this informational data must be aggregated in one place for future study and analysis and must function in tandem with an enterprise asset management platform or computerized maintenance management system. Establishing the synergy between people and processes, CAPM data can be available to the right people at the right time, maximizing inherent reliability within proper context.
1. Reliabilityweb.com, https://reliabilityweb.com/tips/article/inherent_reliability
2. Source: weibull.com, Elsayed, E., Reliability Engineering, Addison Wesley, Reading, MA, 1996.